Tehnilised dokumendid
Spetsifikatsioonid:
Brand
OSI OptoelectronicsWavelength of Peak Sensitivity
670nm
Package Type
TO-8
Mounting Type
Through Hole
Amplifier Function
No
Number of Pins
3
Diode Material
Si
Typical Fall Time
0.08µs
Height
5.59mm
Diameter
15.24mm
Peak Photo Sensitivity
0.4A/W
Series
DL
Typical Rise Time
0.08µs
Polarity
Reverse
Päritoluriik
United States
Toote üksikasjad
OSI Position Sensing Detectors (PSDs)
This family of position sensing detectors (PSD), from OSI Optoelectronics, utilise duo-lateral technology. They provide a continuous analogue output which offer high position accuracy over the majority of the sensing area. One or two dimensional positions can be measured using this range of PSDs.
Suitable applications for these position sensing detectors (PSDs) include; beam alignment, position sensing, angle measurement, height measurements and motion analysis.
Photodiodes, OSI Optoelectronics
€ 253,00
€ 253,00 tk (ilma käibemaksuta)
€ 308,66
€ 308,66 tk (koos käibemaksuga)
1
€ 253,00
€ 253,00 tk (ilma käibemaksuta)
€ 308,66
€ 308,66 tk (koos käibemaksuga)
1
Lao andmed ajutiselt ei ole saadaval.
Palun kontrollige hiljem uuesti.
Tehnilised dokumendid
Spetsifikatsioonid:
Brand
OSI OptoelectronicsWavelength of Peak Sensitivity
670nm
Package Type
TO-8
Mounting Type
Through Hole
Amplifier Function
No
Number of Pins
3
Diode Material
Si
Typical Fall Time
0.08µs
Height
5.59mm
Diameter
15.24mm
Peak Photo Sensitivity
0.4A/W
Series
DL
Typical Rise Time
0.08µs
Polarity
Reverse
Päritoluriik
United States
Toote üksikasjad
OSI Position Sensing Detectors (PSDs)
This family of position sensing detectors (PSD), from OSI Optoelectronics, utilise duo-lateral technology. They provide a continuous analogue output which offer high position accuracy over the majority of the sensing area. One or two dimensional positions can be measured using this range of PSDs.
Suitable applications for these position sensing detectors (PSDs) include; beam alignment, position sensing, angle measurement, height measurements and motion analysis.